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1 Micro-scratching tests of a lead-free solder alloy SAC 305 used in electronic industry [会议论文]

作者:Petrescu, A.M.^1;Stoica, N.A.^1;Tudor, A.^1;等

关键词:Electronic industries;Electronic systems;...

会议举办机构:Department of Machine Elements and Tribology, University Politehnica of Bucharest, Bucharest, Romania^1

会议时间:2019

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2 STM measurements of Ni impurity effects in Bi2212 [会议论文]

作者:Nakagawa, A.^1;Sakaidani, T.^1;Kiguchi, Y.^1;等

关键词:Density of state;Electronic systems;...

会议举办机构:Department of Physics, Schools of Advanced Science and Engineering, Waseda University, Okubo 3-4-1, Shinjuku, Tokyo

会议时间:2017

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3 Resonant plasmon-stimulated nonlinear absorption in three-level systems. [会议论文]

作者:Zasedatelev, A.^1;Dubinina, T.^2,4;Krasovskii, V.^1,3;等

关键词:Electronic systems;Local-field factors;...

会议举办机构:National Research Nuclear University MEPhI, Moscow, Russia^1

会议时间:2015

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4 Low Reynolds turbulence model CFD simulation for complex electronic system: an industrial point of view [会议论文]

作者:Giannuzzi, M.^1

关键词:Complex electronic systems;Conjugate heat transfer;...

会议举办机构:Prompt Engineering Srl, Via Livorno 60, 10144 Torino, Italy^1

会议时间:

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5 Electronic states in the pressure-induced magnetically ordered phase in SmB6 [会议论文]

作者:Mito, Takeshi^1;Emi, Naoya^1;Kawamura, Naomi^2;等

关键词:Critical pressures;Electronic systems;...

会议举办机构:Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo

会议时间:2017

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6 Information Loss from Technological Progress [会议论文]

作者:Townsend, P.D.^1

关键词:Commercial pressure;Electronic systems;...

会议举办机构:Physics Building, University of Sussex, Brighton

会议时间:

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